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Source ID: 2000075661
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Brief Citation: Nakano and Tsuji, Nondestructive Elemental Depth Profiling of Japanese Lacquerware "Tamamushi-nuri" by Confocal 3D XRF Analysis in Comparison with Micro GEXRF, X-Ray Spectrometry (2009)
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Full Citation: Nakano, Kazuhiko, and Kouichi Tsuji. "Nondestructive Elemental Depth Profiling of Japanese Lacquerware "Tamamushi-nuri" by Confocal 3D XRF Analysis in Comparison with Micro GEXRF." X-Ray Spectrometry 38/5 (2009): 446-450.
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