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ion scattering spectroscopy (mass spectrometry, analysis and testing techniques, ... Processes and Techniques (hierarchy name)) |
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Note: A surface analysis technique which measures the elastically scattered ion created when a primary ion beam is directed at the sample surface. The kinetic energy of the reflected primary ion depends on the mass of the surface atom involved in scattering, thus revealing information about the sample surface.
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| Terms: |
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| ion scattering spectroscopy (preferred,C,U,English-P,D,U,U)
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| ion scattering spectroscopy (Dutch-P,D,U,U)
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| spectroscopy, ion scattering (C,U,English,UF,U,U)
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| ISS (C,U,A,English,UF,U,U)
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Facet/Hierarchy Code: K.KT |
Hierarchical Position:
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Activities Facet |
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.... Processes and Techniques (hierarchy name) (G) |
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........ <processes and techniques by specific type> (G) |
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............ analysis and testing techniques (G) |
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................ mass spectrometry (G) |
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.................... ion scattering spectroscopy (G) |
Additional Notes: |
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| Dutch ..... Een oppervlakteanalysetechniek waarin de elastisch verstrooide ionen gemeten worden die gecreëerd worden wanneer een primaire ionenstraal gericht wordt op het oppervlak van het monster. De kinetische energie van het gereflecteerde primaire ion hangt af van de massa van het oppervlakteatoom dat bij de verstrooiing betrokken was. Op deze manier wordt er informatie verkregen over het monster. |
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Sources and Contributors: |
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