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secondary neutral mass spectrometry (mass spectrometry, analysis and testing techniques, ... Processes and Techniques (hierarchy name)) |
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Note: Technique closely related to secondary ion mass spectroscopy (SIMS), varying from it only in the strict separation between emission and ionization of the sputtered particles from the sample surface. Neutral atoms are detected by post-ionising any atoms that are ejected from the surface. This post-ionisation can be accomplished by using lasers or electron bombardment of the atoms entering the mass analyser.
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| Terms: |
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| secondary neutral mass spectrometry (preferred,C,U,English-P,D,U,U)
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| secondary neutral mass spectrometry (Dutch-P,D,U,U)
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| spectrometry, secondary neutral mass (C,U,English,UF,U,U)
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| SNMS (C,U,English,UF,U,U)
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| sputtered neutral mass spectrometry (C,U,English,UF,U,U)
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Facet/Hierarchy Code: K.KT |
Hierarchical Position:
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Activities Facet |
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.... Processes and Techniques (hierarchy name) (G) |
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........ <processes and techniques by specific type> (G) |
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............ analysis and testing techniques (G) |
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................ mass spectrometry (G) |
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.................... secondary neutral mass spectrometry (G) |
Additional Notes: |
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| Dutch ..... Een techniek die nauw verwant is aan secondary ion mass spectroscopy (SIMS), met als enige verschil de strikte scheiding tussen de emissie en de ionisering van de deeltjes die van het oppervlak van het monster 'gesputterd' zijn. Neutrale atomen worden gedetecteerd door alle atomen die uit het oppervlak gestoten worden, te post-ioniseren. Deze post-ionisering kan bewerkstelligd worden door middel van lasers of een elektronenbombardement van de atomen die de massa-analysator binnengaan. |
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Sources and Contributors: |
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| spectrometry, secondary neutral mass............ |
[GCI, VP] |
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Legacy AAT data |
| sputtered neutral mass spectrometry............ |
[GCI, VP] |
| ........................................................... |
NASA [online] (2013-) accessed 27 May 2014 |
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