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time-of-flight mass spectrometry (mass spectrometry, analysis and testing techniques, ... Processes and Techniques (hierarchy name)) |
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Note: A surface-sensitive mass spectrometry technique in which an ion's mass-to-charge ratio is determined by a time measurement. Particles removed from the atomic monolayers of a surface are accelerated into a flight tube and their mass is measured by the time it takes them to reach the detector.
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| Terms: |
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| time-of-flight mass spectrometry (preferred,C,U,English-P,D,U,U)
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| time-of-flight mass spectrometry (Dutch-P,D,U,U)
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| spectrometry, time-of-flight mass (C,U,English,UF,U,U)
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| TOF-MS (C,U,A,English,UF,U,U)
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| TOF/MS (C,U,A,English,UF,U,U)
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Facet/Hierarchy Code: K.KT |
Hierarchical Position:
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Activities Facet |
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.... Processes and Techniques (hierarchy name) (G) |
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........ <processes and techniques by specific type> (G) |
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............ analysis and testing techniques (G) |
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................ mass spectrometry (G) |
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.................... time-of-flight mass spectrometry (G) |
Additional Notes: |
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| Dutch ..... Een oppervlaktegevoelige massaspectrometrietechniek waarin de massa-ladingverhouding van een ion door een tijdmeting wordt vastgesteld. Deeltjes die uit de atomische monolagen van een oppervlak zijn verwijderd, worden versneld in een vluchtbuis, en hun massa wordt gemeten via de tijd die het ze kost om de detector te bereiken. |
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