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total reflection x-ray fluorescence (x-ray fluorescence, fluorescence, ... Associated Concepts (hierarchy name)) |
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Note: Surface elemental analysis technique widely used for identification and characterization of pigments in conservation science. It is an x-ray fluorescence technique in which an incident beam strikes a sample below the critical angle of external total reflection for X-rays resulting in nearly total reflection of the excitation beam photons.
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| Terms: |
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| total reflection x-ray fluorescence (preferred,C,U,English,UF,U,U)
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| total reflection x-ray fluorescence (Dutch-P,D,U,U)
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| fluorescence, total reflection x-ray (C,U,English,UF,U,U)
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| total reflection x-ray fluorescence spectrometry (C,U,English,UF,U,U)
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| TXRF (C,U,A,English,UF,U,U)
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Facet/Hierarchy Code: B.BM |
Hierarchical Position:
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Associated Concepts Facet |
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.... Associated Concepts (hierarchy name) (G) |
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........ scientific concepts (G) |
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............ physical sciences concepts (G) |
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................ physics concepts (G) |
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.................... <energy and related concepts> (G) |
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........................ energy-related concepts (G) |
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............................ light-related concepts (G) |
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................................ luminescence (G) |
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.................................... fluorescence (G) |
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........................................ x-ray fluorescence (G) |
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............................................ total reflection x-ray fluorescence (G) |
Additional Notes: |
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| Dutch ..... Een elementaire oppervlakteanalysetechniek die veel wordt gebruikt in de conserveringswetenschap voor de identificatie en analyse van pigmenten. In deze röntgenfluorescentietechniek wordt een straal op het monster afgevuurd vanuit een hoek die kleiner is dan de kritische hoek van externe totale reflectie van röntgenstralen. Hierdoor vindt een bijna algehele reflectie van de fotonen in de excitatiestraal plaats. |
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